Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 193
... counting rate , i.e. , the rate of production of current pulses in the external circuit . The applied voltage is then gradually increased from zero , and the counting rate is found to vary with voltage in the manner shown in Fig . 7-11 ...
... counting rate , i.e. , the rate of production of current pulses in the external circuit . The applied voltage is then gradually increased from zero , and the counting rate is found to vary with voltage in the manner shown in Fig . 7-11 ...
Page 197
... counting rate on counting losses ( schematic ) . Since the resolving time of the ordinary Geiger counter is of the order of 10 sec , counting - rate curves should be linear up to about 10,000 cps ( counts per second ) if the arrival of ...
... counting rate on counting losses ( schematic ) . Since the resolving time of the ordinary Geiger counter is of the order of 10 sec , counting - rate curves should be linear up to about 10,000 cps ( counts per second ) if the arrival of ...
Page 208
... counting rate ) , the spacing of the counter pulses is random in time , which means that the counting rate actually varies with time over short periods . The ratemeter responds to these statistical fluctuations in the counting rate ...
... counting rate ) , the spacing of the counter pulses is random in time , which means that the counting rate actually varies with time over short periods . The ratemeter responds to these statistical fluctuations in the counting rate ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone