## Elements of X-ray Diffraction |

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Page 110

The actual calculation of/ involves sin 6 rather than 6, so that the net effect is that /

atoms and various values of (sin 0)/X are tabulated in Appendix 8, and a curve ...

The actual calculation of/ involves sin 6 rather than 6, so that the net effect is that /

**decreases**as the quantity (sin 6)/X increases. Calculated values of / for variousatoms and various values of (sin 0)/X are tabulated in Appendix 8, and a curve ...

Page 130

Bernard Dennis Cullity. high-0 and low-0 reflections

absorption coefficient of the specimen

greater for the low-0 reflections. (These remarks apply only to the cylindrical

specimen ...

Bernard Dennis Cullity. high-0 and low-0 reflections

**decreases**as the linearabsorption coefficient of the specimen

**decreases**, but the absorption is alwaysgreater for the low-0 reflections. (These remarks apply only to the cylindrical

specimen ...

Page 367

For example, a

intensity of a superlattice line by about 30 percent. The weakening of super-

lattice lines by partial disorder is illustrated in Fig. 13-3. By comparing the

integrated ...

For example, a

**decrease**in order from S = 1.00 to S = 0.84**decreases**theintensity of a superlattice line by about 30 percent. The weakening of super-

lattice lines by partial disorder is illustrated in Fig. 13-3. By comparing the

integrated ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone