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Page 110
... decreases as fcu f the quantity ( sin 0 ) / λ increases . 30 - 29 20 10 ᅡ 0 0 0.2 0.4 0.6 0.8 1.0 sin 0 ( A - 1 ) λ Calculated values of ƒ for various atoms and various values of ( sin 0 ) / λ are tabulated in Appendix 8 , and a curve ...
... decreases as fcu f the quantity ( sin 0 ) / λ increases . 30 - 29 20 10 ᅡ 0 0 0.2 0.4 0.6 0.8 1.0 sin 0 ( A - 1 ) λ Calculated values of ƒ for various atoms and various values of ( sin 0 ) / λ are tabulated in Appendix 8 , and a curve ...
Page 130
Bernard Dennis Cullity. high- and low - 0 reflections decreases as the linear absorption coefficient of the specimen decreases , but the absorption is always greater for the low - 0 reflections . ( These remarks apply only to the ...
Bernard Dennis Cullity. high- and low - 0 reflections decreases as the linear absorption coefficient of the specimen decreases , but the absorption is always greater for the low - 0 reflections . ( These remarks apply only to the ...
Page 367
... decrease in order from S = 1.00 to S = 0.84 decreases the in- tensity of a superlattice line by about 30 percent . The weakening of super- lattice lines by partial disorder is illustrated in Fig . 13-3 . By comparing the integrated ...
... decrease in order from S = 1.00 to S = 0.84 decreases the in- tensity of a superlattice line by about 30 percent . The weakening of super- lattice lines by partial disorder is illustrated in Fig . 13-3 . By comparing the integrated ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone