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Page 131
angles ; however , if the comparison of line intensities is restricted to lines not
differing too greatly in 8 values , the absorption ... Besides decreasing the
intensity of diffraction lines , it causes some general coherent scattering in all
directions .
angles ; however , if the comparison of line intensities is restricted to lines not
differing too greatly in 8 values , the absorption ... Besides decreasing the
intensity of diffraction lines , it causes some general coherent scattering in all
directions .
Page 299
The powder pattern of the unknown is obtained with a Debye - Scherrer camera
or a diffractometer , the object being to cover as wide an angular range of 20 as
possible . A camera such as the Seemann - Bohlin , which records diffraction
lines ...
The powder pattern of the unknown is obtained with a Debye - Scherrer camera
or a diffractometer , the object being to cover as wide an angular range of 20 as
possible . A camera such as the Seemann - Bohlin , which records diffraction
lines ...
Page 350
It is important to remember that a diffraction pattern of a given phase is
characterized not only by line positions but also ... This means that the presence
of phase X in a mixture of phases cannot be proved merely by coincidence of the
lines of ...
It is important to remember that a diffraction pattern of a given phase is
characterized not only by line positions but also ... This means that the presence
of phase X in a mixture of phases cannot be proved merely by coincidence of the
lines of ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |