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Page 184
If not enough powder is available for a flat specimen , a thin - rod specimen of the
kind used in Debye - Scherrer cameras may be used ; it is mounted on the
diffractometer axis and continuously rotated by a small motor ( see Fig . 7 – 3 ) .
If not enough powder is available for a flat specimen , a thin - rod specimen of the
kind used in Debye - Scherrer cameras may be used ; it is mounted on the
diffractometer axis and continuously rotated by a small motor ( see Fig . 7 – 3 ) .
Page 237
8 - 4 Diffractometer method . Still another method of determining crystal
orientation involves the use of the diffractometer and a procedure radically
different from that of either Laue method . With the essentially monochromatic
radiation used in ...
8 - 4 Diffractometer method . Still another method of determining crystal
orientation involves the use of the diffractometer and a procedure radically
different from that of either Laue method . With the essentially monochromatic
radiation used in ...
Page 285
9 - 9 The texture of sheet ( diffractometer method ) . In recent years methods have
been developed for the determination of pole figures with the diffractometer .
These methods are capable of quite high precision because ( 1 ) the intensity of
the ...
9 - 9 The texture of sheet ( diffractometer method ) . In recent years methods have
been developed for the determination of pole figures with the diffractometer .
These methods are capable of quite high precision because ( 1 ) the intensity of
the ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |