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Page 37
2 – 6 Lattice directions and planes . The direction of any line in a lattice may be
described by first drawing a line through the origin parallel to the given line and
then giving the coordinates of any point on the line through the origin . Let the
line ...
2 – 6 Lattice directions and planes . The direction of any line in a lattice may be
described by first drawing a line through the origin parallel to the given line and
then giving the coordinates of any point on the line through the origin . Let the
line ...
Page 82
This is also the path difference for the overlapping rays scattered by S and P in
the direction shown , since in this direction there is no path difference between
rays scattered by S and L or P and K . Scattered rays l ' and 2 ' will be completely
in ...
This is also the path difference for the overlapping rays scattered by S and P in
the direction shown , since in this direction there is no path difference between
rays scattered by S and L or P and K . Scattered rays l ' and 2 ' will be completely
in ...
Page 106
Bernard Dennis Cullity. where lo = intensity of the incident beam , c = velocity of
light , and a = angle between the scattering direction and the direction of
acceleration of the electron . Suppose the incident beam is traveling in the
direction Ox ...
Bernard Dennis Cullity. where lo = intensity of the incident beam , c = velocity of
light , and a = angle between the scattering direction and the direction of
acceleration of the electron . Suppose the incident beam is traveling in the
direction Ox ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |