Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 35
... elements possessed by each crystal system is listed in Table 2-2 . Some crystals may possess more than the minimum symmetry elements required by the system to which they belong , but none may have less . Symmetry operations apply not ...
... elements possessed by each crystal system is listed in Table 2-2 . Some crystals may possess more than the minimum symmetry elements required by the system to which they belong , but none may have less . Symmetry operations apply not ...
Page 407
... elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The upper limit of ...
... elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The upper limit of ...
Page 417
... elements are rapidly and directly indicated on a chart or set of dials . Because such spectrometers must be preset and precalibrated for each particular element determined , they are suitable only for control laboratories where large ...
... elements are rapidly and directly indicated on a chart or set of dials . Because such spectrometers must be preset and precalibrated for each particular element determined , they are suitable only for control laboratories where large ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone