## Elements of X-ray Diffraction |

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Page 204

Clearly, the accuracy of a rate measurement of this kind improves as the time of

counting is prolonged, and it is therefore important to know how long to count in

order to attain a specified degree of accuracy. The probable

Clearly, the accuracy of a rate measurement of this kind improves as the time of

counting is prolonged, and it is therefore important to know how long to count in

order to attain a specified degree of accuracy. The probable

**error*** in a single ...Page 327

(a) (b) Fig. 11-3. Effect of specimen displacement on line positions. The

shrinkage

enters through a hole in the film, since corresponding back- reflection lines are

then only a ...

(a) (b) Fig. 11-3. Effect of specimen displacement on line positions. The

shrinkage

**error**can be minimized by loading the film so that the incident beamenters through a hole in the film, since corresponding back- reflection lines are

then only a ...

Page 328

which shows how an

11-3), (11-6), and (11-7), we find that the

specimen is off center is given by <f>AS' <l>(2Ax sin 2<f>) Ax A6c = = = — sin 0

cos ...

which shows how an

**error**in S' alone affects the value of <t>. By combining Eqs. (11-3), (11-6), and (11-7), we find that the

**error**in <f> due to the fact that thespecimen is off center is given by <f>AS' <l>(2Ax sin 2<f>) Ax A6c = = = — sin 0

cos ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone