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Page 88
Similarly , any published table of wavelengths can be tested for the correctness of
its units by noting the wavelength given for a particular characteristic line , Cu
Kay for example . The wavelength of this line is 1 . 54051A or 1 . 53740 kX .
Similarly , any published table of wavelengths can be tested for the correctness of
its units by noting the wavelength given for a particular characteristic line , Cu
Kay for example . The wavelength of this line is 1 . 54051A or 1 . 53740 kX .
Page 120
Suppose for example , that h and I are even and k is odd , e . g . , 012 . Then F = f
( 1 – 1 + 1 – 1 ) ... The reader may have noticed in the previous examples that
some of the information given was not used in the calculations . In ( a ) , for
example ...
Suppose for example , that h and I are even and k is odd , e . g . , 012 . Then F = f
( 1 – 1 + 1 – 1 ) ... The reader may have noticed in the previous examples that
some of the information given was not used in the calculations . In ( a ) , for
example ...
Page 273
For example , some control of the texture of rolled sheet is possible by the correct
choice of degree of deformation , annealing temperature , and annealing time .
The industrial importance of preferred orientation lies in the effect , often very ...
For example , some control of the texture of rolled sheet is possible by the correct
choice of degree of deformation , annealing temperature , and annealing time .
The industrial importance of preferred orientation lies in the effect , often very ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |