Elements of X-ray Diffraction |
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Page 88
Similarly, any published table of wavelengths can be tested for the correctness of
its units by noting the wavelength given for a particular characteristic line, Cu Kai
for example. The wavelength of this line is 1.54051 A or 1.53740 kX.
Similarly, any published table of wavelengths can be tested for the correctness of
its units by noting the wavelength given for a particular characteristic line, Cu Kai
for example. The wavelength of this line is 1.54051 A or 1.53740 kX.
Page 120
Suppose for example, that h and I are even and k is odd, e.g., 012. Then F = f(l —
1 + 1 — 1)=0, and no reflection occurs. F = 0 for mixed indices; F2 = 0 Thus,
reflections will occur for such planes as (111), (200), and (220) but not for the
planes ...
Suppose for example, that h and I are even and k is odd, e.g., 012. Then F = f(l —
1 + 1 — 1)=0, and no reflection occurs. F = 0 for mixed indices; F2 = 0 Thus,
reflections will occur for such planes as (111), (200), and (220) but not for the
planes ...
Page 378
For example, if a sample contains the compound AxBy, the diffraction method will
disclose the presence of AxBy as such, whereas ordinary chemical analysis
would show only the presence of elements A and B. Furthermore, if the sample ...
For example, if a sample contains the compound AxBy, the diffraction method will
disclose the presence of AxBy as such, whereas ordinary chemical analysis
would show only the presence of elements A and B. Furthermore, if the sample ...
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |