## Elements of X-ray Diffraction |

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Page 123

Bernard Dennis Cullity. It is by these missing reflections, such as 11-1, 11-3, 22-1

, 22-3, that a hexagonal structure is recognized as being close-packed. Not all

the reflections present have the same structure

...

Bernard Dennis Cullity. It is by these missing reflections, such as 11-1, 11-3, 22-1

, 22-3, that a hexagonal structure is recognized as being close-packed. Not all

the reflections present have the same structure

**factor**. For example, if (h + 2k) is a...

Page 128

Intersection of cones of diffracted rays with Debye-Scherrer film. thus leads to a

third geometrical

diffraction line being 2irR sin 26b, where R is the radius of the camera, the

relative ...

Intersection of cones of diffracted rays with Debye-Scherrer film. thus leads to a

third geometrical

**factor**affecting the intensity of a reflection. The length of anydiffraction line being 2irR sin 26b, where R is the radius of the camera, the

relative ...

Page 132

We are now in a position to gather together the

sections into an equation for the relative intensity of powder pattern lines : „ /l +

cos2 20> /= \F\2p — \ sin 6 cos 6 / (4-12) where / = relative integrated intensity ...

We are now in a position to gather together the

**factors**discussed in precedingsections into an equation for the relative intensity of powder pattern lines : „ /l +

cos2 20> /= \F\2p — \ sin 6 cos 6 / (4-12) where / = relative integrated intensity ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone