Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 24
INTENSITY h FILM SENSITIVITY K edge of silver ( 0 . 48A ) - K edge of bromine (
0 . 92A ) Cu Kα Дмо , к . Photographic film is affected by X - rays in much the
same way as by visible light , and film is the most widely used means of recording
...
INTENSITY h FILM SENSITIVITY K edge of silver ( 0 . 48A ) - K edge of bromine (
0 . 92A ) Cu Kα Дмо , к . Photographic film is affected by X - rays in much the
same way as by visible light , and film is the most widely used means of recording
...
Page 154
644 Film loading . Figure 6 - 5 illustrates three methods of arranging the film strip
in the Debye method . The small sketches on the right show the loaded film in
relation to the incident beam , while the films laid out flat are indicated on the left .
644 Film loading . Figure 6 - 5 illustrates three methods of arranging the film strip
in the Debye method . The small sketches on the right show the loaded film in
relation to the incident beam , while the films laid out flat are indicated on the left .
Page 218
where OC = D = specimen - film distance . The angles u and o are obtained from
y and 8 as follows : CF tan 8 tan 8 FN tan u =FO CF siny sin y ON tan o = = / FNV
(\ sin u / \ CF cos y F tan 8 \ / 1 sinu , \ CF cos y tan 8 sin u cos y With these ...
where OC = D = specimen - film distance . The angles u and o are obtained from
y and 8 as follows : CF tan 8 tan 8 FN tan u =FO CF siny sin y ON tan o = = / FNV
(\ sin u / \ CF cos y F tan 8 \ / 1 sinu , \ CF cos y tan 8 sin u cos y With these ...
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Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |