## Elements of X-ray Diffraction |

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Page 154

6-4

the Debye method. The small sketches on the right show the loaded

relation to the incident beam, while the

In (a) ...

6-4

**Film**loading. Figure 6-5 illustrates three methods of arranging the**film**strip inthe Debye method. The small sketches on the right show the loaded

**film**inrelation to the incident beam, while the

**films**laid out flat are indicated on the left.In (a) ...

Page 216

Intersection of a conical array of diffracted beams with a

reflection position. C = crystal, F =

specimens with their plane parallel to the plane of the

sheet ...

Intersection of a conical array of diffracted beams with a

**film**placed in the back-reflection position. C = crystal, F =

**film**, Z.A. = zone axis. mount sheet or platespecimens with their plane parallel to the plane of the

**film**and one edge of thesheet ...

Page 218

where OC = D = specimen-

and 8 as follows: FN CF tan 8 tan 8 tan n = = FO CF sin y sin 7 ON tan a = OC /FN

\/ 1 \ _ /CF tan 8\ / 1 \ Vsin \i) \CF cos 7/ \ sin n ) \CF cos 7/ tan 8 sin m cos 7 With ...

where OC = D = specimen-

**film**distance. The angles /x and a are obtained from 7and 8 as follows: FN CF tan 8 tan 8 tan n = = FO CF sin y sin 7 ON tan a = OC /FN

\/ 1 \ _ /CF tan 8\ / 1 \ Vsin \i) \CF cos 7/ \ sin n ) \CF cos 7/ tan 8 sin m cos 7 With ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone