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Page 403
15 - 1 . Fluorescent x - ray spectroscopy . use in recent years . The phenomenon
of fluorescence , which is just a nuisance in diffraction experiments , is here made
to serve a useful purpose . It may be helpful to compare some features of x - ray ...
15 - 1 . Fluorescent x - ray spectroscopy . use in recent years . The phenomenon
of fluorescence , which is just a nuisance in diffraction experiments , is here made
to serve a useful purpose . It may be helpful to compare some features of x - ray ...
Page 407
would cause K fluorescence in tellurium ( atomic number 52 ) , and the emitted
Ka radiation would have a wavelength of 0 . 45A . At a tube voltage of 50 kv , little
or no K fluorescence is produced in elements with atomic numbers greater than ...
would cause K fluorescence in tellurium ( atomic number 52 ) , and the emitted
Ka radiation would have a wavelength of 0 . 45A . At a tube voltage of 50 kv , little
or no K fluorescence is produced in elements with atomic numbers greater than ...
Page 416
The absorption of the fluorescent radiation , of wavelength da , depends only on
the absorption coefficient of the specimen for that particular wavelength . (
Absorption effects are particularly noticeable in the Fe - Al and Fe - Ag curves of
Fig .
The absorption of the fluorescent radiation , of wavelength da , depends only on
the absorption coefficient of the specimen for that particular wavelength . (
Absorption effects are particularly noticeable in the Fe - Al and Fe - Ag curves of
Fig .
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Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone