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Page 116
Or , using the other form given by Eq . ( 4 - 8 ) , we have Ascos 0 + i sin o ) A ( cos
0 – i sin o ) = A ? ( cos ? ¢ + sino ) = A2 . We return now to the problem of adding
the scattered waves from each of the atoms in the unit cell . The amplitude of ...
Or , using the other form given by Eq . ( 4 - 8 ) , we have Ascos 0 + i sin o ) A ( cos
0 – i sin o ) = A ? ( cos ? ¢ + sino ) = A2 . We return now to the problem of adding
the scattered waves from each of the atoms in the unit cell . The amplitude of ...
Page 146
5 – 9 is given by r = c ( - 1 ) . ( 5 – 6 ) In practice , v is very often about twice as
large as u , which means that the conditions illustrated in Fig . 5 - 9 are achieved
when the pinholes are about one - third the size of the projected source .
5 – 9 is given by r = c ( - 1 ) . ( 5 – 6 ) In practice , v is very often about twice as
large as u , which means that the conditions illustrated in Fig . 5 - 9 are achieved
when the pinholes are about one - third the size of the projected source .
Page 360
Thus the constitution of alloy X is given by the relation W ( xd ) = W ( Xe ) . Both
the relative amounts and the compositions of the two phases will vary along any
line which is not a tie line . In a three - phase field , the compositions of the
phases ...
Thus the constitution of alloy X is given by the relation W ( xd ) = W ( Xe ) . Both
the relative amounts and the compositions of the two phases will vary along any
line which is not a tie line . In a three - phase field , the compositions of the
phases ...
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Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |