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Page 270
Equation ( 7 - 2 ) gives the integrated intensity diffracted by an infinitesimally thin
layer located at a depth x below the surface as Ioab wee - ux ( 1 / sin a + 1 / sin B
) dr . ( 7 - 2 ) dId = sina where the various symbols are defined in Sec . 7 – 4 .
Equation ( 7 - 2 ) gives the integrated intensity diffracted by an infinitesimally thin
layer located at a depth x below the surface as Ioab wee - ux ( 1 / sin a + 1 / sin B
) dr . ( 7 - 2 ) dId = sina where the various symbols are defined in Sec . 7 – 4 .
Page 397
and the intensity of a particular line from the standard S by Is = Kacs Mom
Division of one expression by the other gives IA K3CA ' . ( 14 - 13 ) Is Kqcs S (
Note that Mm , the linear absorption coefficient of the mixture and an unknown
quantity ...
and the intensity of a particular line from the standard S by Is = Kacs Mom
Division of one expression by the other gives IA K3CA ' . ( 14 - 13 ) Is Kqcs S (
Note that Mm , the linear absorption coefficient of the mixture and an unknown
quantity ...
Page 487
But even these thin layers of material will give good electron - diffraction patterns
, since electrons are scattered much more ... Combination of Eqs . ( 1 ) and ( 3 )
gives the wavelength of the neutron beam : a = - ( 4 ) V2ME The neutrons issuing
...
But even these thin layers of material will give good electron - diffraction patterns
, since electrons are scattered much more ... Combination of Eqs . ( 1 ) and ( 3 )
gives the wavelength of the neutron beam : a = - ( 4 ) V2ME The neutrons issuing
...
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Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |