Elements of X-ray Diffraction |
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Page 105
1 that an x-ray beam is an electromagnetic wave characterized by an electric field
whose strength varies sinusoidally with ... The scattered beam has the same
wavelength and frequency as the incident beam and is said to be coherent with it,
...
1 that an x-ray beam is an electromagnetic wave characterized by an electric field
whose strength varies sinusoidally with ... The scattered beam has the same
wavelength and frequency as the incident beam and is said to be coherent with it,
...
Page 106
where I0 = intensity of the incident beam, c = velocity of light, and a = angle
between the scattering direction and the direction of acceleration of the electron.
Suppose the incident beam is traveling in the direction Ox (Fig. 4-3) and
encounters ...
where I0 = intensity of the incident beam, c = velocity of light, and a = angle
between the scattering direction and the direction of acceleration of the electron.
Suppose the incident beam is traveling in the direction Ox (Fig. 4-3) and
encounters ...
Page 107
If the values of the constants e, r, m, and c are inserted into this equation, it will be
found that the intensity of the scattered beam is only a minute fraction of the
intensity of the incident beam. The equation also shows that the scattered
intensity ...
If the values of the constants e, r, m, and c are inserted into this equation, it will be
found that the intensity of the scattered beam is only a minute fraction of the
intensity of the incident beam. The equation also shows that the scattered
intensity ...
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |