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Page 105
1 that an x - ray beam is an electromagnetic wave characterized by an electric
field whose strength varies sinusoidally with ... The scattered beam has the same
wavelength and frequency as the incident beam and is said to be coherent with it
...
1 that an x - ray beam is an electromagnetic wave characterized by an electric
field whose strength varies sinusoidally with ... The scattered beam has the same
wavelength and frequency as the incident beam and is said to be coherent with it
...
Page 106
Suppose the incident beam is traveling in the direction Ox ( Fig . 4 - 3 ) and
encounters an electron at O . We wish to know the scattered intensity at P in the
xz plane where OP is inclined at a scattering angle of 20 to the incident beam .
Suppose the incident beam is traveling in the direction Ox ( Fig . 4 - 3 ) and
encounters an electron at O . We wish to know the scattered intensity at P in the
xz plane where OP is inclined at a scattering angle of 20 to the incident beam .
Page 107
If the values of the constants e , r , m , and c are inserted into this equation , it will
be found that the intensity of the scattered beam is only a minute fraction of the
intensity of the incident beam . The equation also shows that the scattered ...
If the values of the constants e , r , m , and c are inserted into this equation , it will
be found that the intensity of the scattered beam is only a minute fraction of the
intensity of the incident beam . The equation also shows that the scattered ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |