Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 110
... increases as the pro- portion of loosely bound electrons increases . The intensity of Compton modified radiation thus increases as the atomic number Z decreases . It is for this reason that it is difficult to obtain good diffraction ...
... increases as the pro- portion of loosely bound electrons increases . The intensity of Compton modified radiation thus increases as the atomic number Z decreases . It is for this reason that it is difficult to obtain good diffraction ...
Page 130
... increases , i.e. , as the temperature increases , since that increases u , or as increases , since high - 0 reflections involve planes of low d value . Thus the intensity of a diffracted beam decreases as the temperature is raised , and ...
... increases , i.e. , as the temperature increases , since that increases u , or as increases , since high - 0 reflections involve planes of low d value . Thus the intensity of a diffracted beam decreases as the temperature is raised , and ...
Page 151
... increases with R. The resolving power may be obtained by differentiating the Bragg law : * λ do = R S 20 dd d But dS do 2R Therefore dS -2R tan 0 dd d FIG . 6-2 . Geometry of the Debye- Scherrer method . Section through film and one ...
... increases with R. The resolving power may be obtained by differentiating the Bragg law : * λ do = R S 20 dd d But dS do 2R Therefore dS -2R tan 0 dd d FIG . 6-2 . Geometry of the Debye- Scherrer method . Section through film and one ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone