## Elements of X-ray Diffraction |

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Page 39

Miller

if a plane is parallel to a given axis, its fractional intercept on that axis is taken as

infinity and the corresponding Miller index is zero. If a plane cuts a negative axis,

...

Miller

**indices**are always cleared of fractions, as shown above. As stated earlier,if a plane is parallel to a given axis, its fractional intercept on that axis is taken as

infinity and the corresponding Miller index is zero. If a plane cuts a negative axis,

...

Page 40

(a) The hexagonal unit cell and (b)

translations of the points at the unit cell corners by the vectors ai, a2, c. Some of

the points so generated are shown in the figure, at the ends of dashed lines, in

order ...

(a) The hexagonal unit cell and (b)

**indices**of planes and directions. repeatedtranslations of the points at the unit cell corners by the vectors ai, a2, c. Some of

the points so generated are shown in the figure, at the ends of dashed lines, in

order ...

Page 41

These are called planes of a form, and the

braces {hkl\, stand for the whole set. In general, planes of a form have the same

spacing but different Miller

...

These are called planes of a form, and the

**indices**of any one plane, enclosed inbraces {hkl\, stand for the whole set. In general, planes of a form have the same

spacing but different Miller

**indices**. For example, the faces of a cube, (100), (010),...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone