## Elements of X-ray Diffraction |

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Page 132

We are now in a position to gather together the factors discussed in preceding

sections into an equation for the relative intensity of powder pattern lines : „ /l +

cos2 20> /= \F\2p — \ sin 6 cos 6 / (4-12) where / = relative

We are now in a position to gather together the factors discussed in preceding

sections into an equation for the relative intensity of powder pattern lines : „ /l +

cos2 20> /= \F\2p — \ sin 6 cos 6 / (4-12) where / = relative

**integrated intensity**...Page 187

But if line intensities are to be compared over the whole range of 20, the same

divergence must be used throughout ... On the other hand, the relative

its ...

But if line intensities are to be compared over the whole range of 20, the same

divergence must be used throughout ... On the other hand, the relative

**integrated****intensity**of a diffraction line is independent of slit width, which is one reason forits ...

Page 205

Three other methods of measuring

which utilize the integrating properties of the scaling circuit to replace the curve

plotting and planimeter measurement: (1) The line is scanned from one side to

the ...

Three other methods of measuring

**integrated intensities**have been used, all ofwhich utilize the integrating properties of the scaling circuit to replace the curve

plotting and planimeter measurement: (1) The line is scanned from one side to

the ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone