Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 204
... measured with the same accuracy , if the counting times are chosen to produce the same total number of counts in each measurement . It also follows that the second scaling method outlined above , in which the time is measured for a ...
... measured with the same accuracy , if the counting times are chosen to produce the same total number of counts in each measurement . It also follows that the second scaling method outlined above , in which the time is measured for a ...
Page 205
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
Page 206
... measured . ( 3 ) A receiving slit is used which is wider than the line being measured . The slit is centered on the line and a count made for a given time . The background is measured by counting at a position adjacent to the line with ...
... measured . ( 3 ) A receiving slit is used which is wider than the line being measured . The slit is centered on the line and a count made for a given time . The background is measured by counting at a position adjacent to the line with ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosĀ² counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone