## Elements of X-ray Diffraction |

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Page 88

... any published table of wavelengths can be tested for the correctness of its units

by noting the wavelength given for a particular characteristic line, Cu Kai for

example. The wavelength of this line is 1.54051 A or 1.53740 kX. 3-5 Diffraction

directions. What determines the possible directions, i.e., the possible angles 20,

in which a given crystal can diffract a beam of monochromatic x-rays? Referring

to Fig. 3-3, we see that various diffraction angles 20i, 262, 203, . . . can be

... any published table of wavelengths can be tested for the correctness of its units

by noting the wavelength given for a particular characteristic line, Cu Kai for

example. The wavelength of this line is 1.54051 A or 1.53740 kX. 3-5 Diffraction

directions. What determines the possible directions, i.e., the possible angles 20,

in which a given crystal can diffract a beam of monochromatic x-rays? Referring

to Fig. 3-3, we see that various diffraction angles 20i, 262, 203, . . . can be

**obtained**from ...Page 133

Column 4: For a cubic crystal, values of sin2 6 are given by Eq. (3-10): 6 = la1 (h"

1 + k2 + I2). In this case, X = 1.542A (Cu Ka) and a = 3.615A (lattice parameter of

copper). Therefore, multiplication of the integers in column 3 by X2/4a2 = 0.0455

gives the values of sin2 6 listed in column 4. In this and similar calculations, slide-

rule accuracy is ample. Column 6: Needed to determine the Lorentz-polarization

factor and (sin 0)/X. Column 7:

Column 4: For a cubic crystal, values of sin2 6 are given by Eq. (3-10): 6 = la1 (h"

1 + k2 + I2). In this case, X = 1.542A (Cu Ka) and a = 3.615A (lattice parameter of

copper). Therefore, multiplication of the integers in column 3 by X2/4a2 = 0.0455

gives the values of sin2 6 listed in column 4. In this and similar calculations, slide-

rule accuracy is ample. Column 6: Needed to determine the Lorentz-polarization

factor and (sin 0)/X. Column 7:

**Obtained**from Appendix 7. Needed to determine ...Page 134

Bernard Dennis Cullity. Column 11:

These values are the product of the values in columns 9, 10, and 11. Column 13:

Values from column 12 recalculated to give the first line an arbitrary intensity of

10. Column 14: These entries give the observed intensities, visually estimated

according to the following simple scale, from the pattern shown in Fig. 3-13(a) (vs

= very strong, s = strong, m = medium, w = weak). The agreement

between ...

Bernard Dennis Cullity. Column 11:

**Obtained**from Appendix 10. Column 12:These values are the product of the values in columns 9, 10, and 11. Column 13:

Values from column 12 recalculated to give the first line an arbitrary intensity of

10. Column 14: These entries give the observed intensities, visually estimated

according to the following simple scale, from the pattern shown in Fig. 3-13(a) (vs

= very strong, s = strong, m = medium, w = weak). The agreement

**obtained**herebetween ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone