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Page 38
But a difficulty then arises when the given plane is parallel to a certain
crystallographic axis , because such a plane does not intercept that axis , i . e . ,
its " intercept ” can only be described as “ infinity . ” To avoid the introduction of
infinity into ...
But a difficulty then arises when the given plane is parallel to a certain
crystallographic axis , because such a plane does not intercept that axis , i . e . ,
its " intercept ” can only be described as “ infinity . ” To avoid the introduction of
infinity into ...
Page 276
Or a given reflection may be of abnormally high intensity , which would indicate
that the corresponding planes were preferentially oriented parallel or nearly
parallel to the sheet surface . As an illustration , the 200 diffractometer reflection
from a ...
Or a given reflection may be of abnormally high intensity , which would indicate
that the corresponding planes were preferentially oriented parallel or nearly
parallel to the sheet surface . As an illustration , the 200 diffractometer reflection
from a ...
Page 494
For such crystals , bı , b2 , and b3 are parallel , respectively , to 21 , 22 , and az ,
while bi , b2 , and b3 are simply the reciprocals of ai , az , and Q3 . In Figs . A15 –
4 and A15 – 5 , four cells of the reciprocal lattice are shown , together with two H
...
For such crystals , bı , b2 , and b3 are parallel , respectively , to 21 , 22 , and az ,
while bi , b2 , and b3 are simply the reciprocals of ai , az , and Q3 . In Figs . A15 –
4 and A15 – 5 , four cells of the reciprocal lattice are shown , together with two H
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |