Elements of X-ray Diffraction |
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Page 38
But a difficulty then arises when the given plane is parallel to a certain
crystallographic axis, because such a plane does not intercept that axis, i.e., its "
intercept" can only be described as "infinity." To avoid the introduction of infinity
into the ...
But a difficulty then arises when the given plane is parallel to a certain
crystallographic axis, because such a plane does not intercept that axis, i.e., its "
intercept" can only be described as "infinity." To avoid the introduction of infinity
into the ...
Page 276
Or a given reflection may be of abnormally high intensity, which would indicate
that the corresponding planes were preferentially oriented parallel or nearly
parallel to the sheet surface. As an illustration, the 200 diffractometer reflection
from a ...
Or a given reflection may be of abnormally high intensity, which would indicate
that the corresponding planes were preferentially oriented parallel or nearly
parallel to the sheet surface. As an illustration, the 200 diffractometer reflection
from a ...
Page 494
For such crystals, bi, b2, and b3 are parallel, respectively, to ai, a2, and a3, while
b\, b2, and 63 are simply the reciprocals of Oi, a2, and a3. In Figs. A15-4 and A15
-5, four cells of the reciprocal lattice are shown, together with two H vectors in ...
For such crystals, bi, b2, and b3 are parallel, respectively, to ai, a2, and a3, while
b\, b2, and 63 are simply the reciprocals of Oi, a2, and a3. In Figs. A15-4 and A15
-5, four cells of the reciprocal lattice are shown, together with two H vectors in ...
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |