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Page 357
In this way , we have located one point on the solvus curve , namely x percent B
at T1 . Other points could be found in a similar manner . For example , if the same
series of alloys were equilibrated at temperature T2 , a parameter curve similar ...
In this way , we have located one point on the solvus curve , namely x percent B
at T1 . Other points could be found in a similar manner . For example , if the same
series of alloys were equilibrated at temperature T2 , a parameter curve similar ...
Page 369
But ordering can also take place in alloys containing somewhat more , or
somewhat less , than 25 atomic percent gold , as shown by the phase diagram of
Fig . 13 - 5 . ( Here the ordered phase is designated a ' to distinguish it from the ...
But ordering can also take place in alloys containing somewhat more , or
somewhat less , than 25 atomic percent gold , as shown by the phase diagram of
Fig . 13 - 5 . ( Here the ordered phase is designated a ' to distinguish it from the ...
Page 396
TABLE 14 - 6 COMPARISON OF AUSTENITE DETERMINATION BY X - RAY
DIFFRACTION AND LINEAL ANALYSIS * Austenitizing temperature ( °C )
Volume percent carbides Volume percent retained austenite x - ray lineal
analysis 955 900 ...
TABLE 14 - 6 COMPARISON OF AUSTENITE DETERMINATION BY X - RAY
DIFFRACTION AND LINEAL ANALYSIS * Austenitizing temperature ( °C )
Volume percent carbides Volume percent retained austenite x - ray lineal
analysis 955 900 ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |