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Page 350
This may be difficult in some alloy systems where the phases involved have
complex diffraction patterns , or where it is ... It is important to remember that a
diffraction pattern of a given phase is characterized not only by line positions but
also by ...
This may be difficult in some alloy systems where the phases involved have
complex diffraction patterns , or where it is ... It is important to remember that a
diffraction pattern of a given phase is characterized not only by line positions but
also by ...
Page 359
The determination of a ternary phase diagram is naturally more complicated than
that of a binary diagram , because of the extra composition variable involved , but
the same general principles can be applied . The x - ray methods described ...
The determination of a ternary phase diagram is naturally more complicated than
that of a binary diagram , because of the extra composition variable involved , but
the same general principles can be applied . The x - ray methods described ...
Page 361
relative amounts of these phases , say in alloy Y , we draw a line through Y to any
corner of the triangle , say b , and apply the ... These relations form the basis of
the disappearing - phase method of locating the sides and corners of the three ...
relative amounts of these phases , say in alloy Y , we draw a line through Y to any
corner of the triangle , say b , and apply the ... These relations form the basis of
the disappearing - phase method of locating the sides and corners of the three ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |