Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 163
... photograph . Either a trans- mission or a back - reflection camera may be used . A typical transmission photograph ... PHOTOGRAPHS Pinhole photographs.
... photograph . Either a trans- mission or a back - reflection camera may be used . A typical transmission photograph ... PHOTOGRAPHS Pinhole photographs.
Page 260
... photograph can yield semiquantitative information about grain size , together with infor- mation about crystal perfection and orientation . A transmission or back- reflection pinhole photograph made with filtered radiation is best . If ...
... photograph can yield semiquantitative information about grain size , together with infor- mation about crystal perfection and orientation . A transmission or back- reflection pinhole photograph made with filtered radiation is best . If ...
Page 280
... photograph resembles that of a drawn wire : it contains Debye rings of nonuniform intensity and the pattern is symmetrical about a vertical line through the center of the film . However , if the sheet is now rotated by , say , 10 ...
... photograph resembles that of a drawn wire : it contains Debye rings of nonuniform intensity and the pattern is symmetrical about a vertical line through the center of the film . However , if the sheet is now rotated by , say , 10 ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosĀ² counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone