Elements of X-ray Diffraction |
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Page 163
The fact that resolution of the Ka doublet normally occurs only in the back-
reflection region can be seen from the Debye photographs reproduced in Fig. 3-
13. 6-9 Pinhole photographs. When monochromatic radiation is used to examine
a ...
The fact that resolution of the Ka doublet normally occurs only in the back-
reflection region can be seen from the Debye photographs reproduced in Fig. 3-
13. 6-9 Pinhole photographs. When monochromatic radiation is used to examine
a ...
Page 260
Although x-ray diffraction is decidedly inferior to microscopic examination in the
accurate measurement of grain size, one diffraction photograph can yield
semiquantitative information about grain size, together with information about
crystal ...
Although x-ray diffraction is decidedly inferior to microscopic examination in the
accurate measurement of grain size, one diffraction photograph can yield
semiquantitative information about grain size, together with information about
crystal ...
Page 280
The resulting photograph resembles that of a drawn wire: it contains Debye rings
of nonuniform intensity and the pattern is symmetrical about a vertical line
through the center of the film. However, if the sheet is now rotated by, say, 10°
about ...
The resulting photograph resembles that of a drawn wire: it contains Debye rings
of nonuniform intensity and the pattern is symmetrical about a vertical line
through the center of the film. However, if the sheet is now rotated by, say, 10°
about ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |