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Page 163
The fact that resolution of the Ka doublet normally occurs only in the back -
reflection region can be seen from the Debye photographs reproduced in Fig . 3
– 13 . 6 - 9 Pinhole photographs . When monochromatic radiation is used to
examine a ...
The fact that resolution of the Ka doublet normally occurs only in the back -
reflection region can be seen from the Debye photographs reproduced in Fig . 3
– 13 . 6 - 9 Pinhole photographs . When monochromatic radiation is used to
examine a ...
Page 260
A transmission or backreflection pinhole photograph made with filtered radiation
is best . If the back - reflection method is ... changes produced in pinhole
photographs by progressive reductions in specimen grain size is illustrated in Fig
. 9 - 1 .
A transmission or backreflection pinhole photograph made with filtered radiation
is best . If the back - reflection method is ... changes produced in pinhole
photographs by progressive reductions in specimen grain size is illustrated in Fig
. 9 - 1 .
Page 280
The resulting photograph resembles that of a drawn wire : it contains Debye rings
of nonuniform intensity and the pattern is symmetrical about a vertical line
through the center of the film . However , if the sheet is now rotated by , say , 10°
about ...
The resulting photograph resembles that of a drawn wire : it contains Debye rings
of nonuniform intensity and the pattern is symmetrical about a vertical line
through the center of the film . However , if the sheet is now rotated by , say , 10°
about ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |