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Page 41
In any crystal system there are sets of equivalent lattice planes related by
symmetry . These are called planes of a form , and the indices of any one plane ,
enclosed in braces { hkl } , stand for the whole set . In general , planes of a form
have ...
In any crystal system there are sets of equivalent lattice planes related by
symmetry . These are called planes of a form , and the indices of any one plane ,
enclosed in braces { hkl } , stand for the whole set . In general , planes of a form
have ...
Page 97
3 – 2 is such that the path difference for rays scattered by the first and second
planes is only a quarter wavelength . These rays do not annul one another but ,
as we saw in Fig . 3 - 1 , simply unite to form a beam of smaller amplitude than
that ...
3 – 2 is such that the path difference for rays scattered by the first and second
planes is only a quarter wavelength . These rays do not annul one another but ,
as we saw in Fig . 3 - 1 , simply unite to form a beam of smaller amplitude than
that ...
Page 124
In the powder specimen , some of the crystals will be so oriented that reflection
can occur from their ( 100 ) planes . Other crystals of different orientation may be
in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes .
In the powder specimen , some of the crystals will be so oriented that reflection
can occur from their ( 100 ) planes . Other crystals of different orientation may be
in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes .
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |