## Elements of X-ray Diffraction |

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Page 37

The coordinates of a point

operator which, when "applied" to a point at the origin, will move or translate it to

the

The coordinates of a point

**position**, such as 2 2 h, may a^so De regarded as anoperator which, when "applied" to a point at the origin, will move or translate it to

the

**position**\ \ \, the final**position**being obtained by simple addition of the ...Page 69

The final

diametrically opposite B\. ... coincidence with one or the other of the two latter

axes, the given rotation performed, and the axis then rotated back to its original

The final

**position**of this pole on the positive side of the projection is at B2diametrically opposite B\. ... coincidence with one or the other of the two latter

axes, the given rotation performed, and the axis then rotated back to its original

**position**.Page 241

The crystal is now in

axes. The next rotation is performed about the E'W'-axis, which requires that the

underlying Wulff net be arranged with its equator vertical so that the latitude lines

will ...

The crystal is now in

**Position**2, shown by open symbols referred to N'S'E'W-axes. The next rotation is performed about the E'W'-axis, which requires that the

underlying Wulff net be arranged with its equator vertical so that the latitude lines

will ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone