## Elements of X-ray Diffraction |

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Page 132

4-12 Intensities of

together the factors discussed in preceding sections into an equation for the

relative intensity of

4-12) ...

4-12 Intensities of

**powder pattern**lines. We are now in a position to gathertogether the factors discussed in preceding sections into an equation for the

relative intensity of

**powder pattern**lines : „ /l + cos2 20> /= \F\2p — \ sin 6 cos 6 / (4-12) ...

Page 299

determination to unravel any simple structures he may encounter and, what is

more important, he must be able to index the

known structure, as this is a routine problem in almost all diffraction work.

determination to unravel any simple structures he may encounter and, what is

more important, he must be able to index the

**powder patterns**of substances ofknown structure, as this is a routine problem in almost all diffraction work.

Page 323

The

whose sin2 6 values are 0.1118, 0.1487, 0.294, 0.403, 0.439, 0.583, 0.691, 0.727

, 0.872, and 0.981. Index these lines and calculate the lattice parameter. 10-2.

The

**powder pattern**of aluminum, made with Cu Ka radiation, contains ten lines,whose sin2 6 values are 0.1118, 0.1487, 0.294, 0.403, 0.439, 0.583, 0.691, 0.727

, 0.872, and 0.981. Index these lines and calculate the lattice parameter. 10-2.

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone