Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 174
... proportional to the exposure up to a density of about 1.0 ( which corre- sponds to 10 percent transmission of the incident light ) . Here , " exposure " is defined by the relation Exposure = ( intensity of x - ray beam ) ( time ) ...
... proportional to the exposure up to a density of about 1.0 ( which corre- sponds to 10 percent transmission of the incident light ) . Here , " exposure " is defined by the relation Exposure = ( intensity of x - ray beam ) ( time ) ...
Page 192
... proportional counter 104 avalanche region 103 102 ionization 10 chamber 1 VOLTAGE FIG . 7-10 . Effect of voltage on the gas amplification factor . ( H. Friedman , Proc . I.R.E. 37 , 791 , 1949. ) tion do not acquire enough energy to ...
... proportional counter 104 avalanche region 103 102 ionization 10 chamber 1 VOLTAGE FIG . 7-10 . Effect of voltage on the gas amplification factor . ( H. Friedman , Proc . I.R.E. 37 , 791 , 1949. ) tion do not acquire enough energy to ...
Page 193
... proportional counter to be operated under essentially monochromatic conditions . For example , if a diffraction pattern is being obtained with copper radiation , the analyzer can be set to pass only pulses due to Cu Ka radiation and ...
... proportional counter to be operated under essentially monochromatic conditions . For example , if a diffraction pattern is being obtained with copper radiation , the analyzer can be set to pass only pulses due to Cu Ka radiation and ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosĀ² counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone