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Page 174
For most x - ray films , the density is directly proportional to the exposure up to a
density of about 1 . 0 ( which corresponds to 10 percent transmission of the
incident light ) . Here , “ exposure " is defined by the relation Exposure = (
intensity of x ...
For most x - ray films , the density is directly proportional to the exposure up to a
density of about 1 . 0 ( which corresponds to 10 percent transmission of the
incident light ) . Here , “ exposure " is defined by the relation Exposure = (
intensity of x ...
Page 192
10127 10114 glow discharge Geiger counter y corona | discharge
AMPLIFICATION FACTOR proportional counter I i avalanche i region ionization ,
chamber - - - - - - - VOLTAGE Fig . 7 – 10 . Effect of voltage on the gas
amplification factor .
10127 10114 glow discharge Geiger counter y corona | discharge
AMPLIFICATION FACTOR proportional counter I i avalanche i region ionization ,
chamber - - - - - - - VOLTAGE Fig . 7 – 10 . Effect of voltage on the gas
amplification factor .
Page 193
Such a device allows a proportional counter to be operated under essentially
monochromatic conditions . For example , if a diffraction pattern is being obtained
with copper radiation , the analyzer can be set to pass only pulses due to Cu Ka ...
Such a device allows a proportional counter to be operated under essentially
monochromatic conditions . For example , if a diffraction pattern is being obtained
with copper radiation , the analyzer can be set to pass only pulses due to Cu Ka ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |