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Page 1
Bernard Dennis Cullity. CHAPTER 1 PROPERTIES OF X - RAYS 1-1 Introduction . X - rays were discovered in 1895 by the German physicist Roentgen and were so named because their nature was unknown at the time . Unlike ordinary light , these ...
Bernard Dennis Cullity. CHAPTER 1 PROPERTIES OF X - RAYS 1-1 Introduction . X - rays were discovered in 1895 by the German physicist Roentgen and were so named because their nature was unknown at the time . Unlike ordinary light , these ...
Page 80
... ray 2 is diverted by some means into a curved path before rejoining ray 3. What is the situation on the wave front BB ' where both rays are proceeding in the original direction ? On this front , the electric vector of ray 2 has its ...
... ray 2 is diverted by some means into a curved path before rejoining ray 3. What is the situation on the wave front BB ' where both rays are proceeding in the original direction ? On this front , the electric vector of ray 2 has its ...
Page 97
... rays scattered by the first and second planes is only a quarter wavelength . These rays do not annul one another but , as we saw in Fig . 3-1 , simply unite to form a beam of smaller amplitude than that formed by two rays which are ...
... rays scattered by the first and second planes is only a quarter wavelength . These rays do not annul one another but , as we saw in Fig . 3-1 , simply unite to form a beam of smaller amplitude than that formed by two rays which are ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosĀ² counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone