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Page 154
644 Film loading . Figure 6 - 5 illustrates three methods of arranging the film strip
in the Debye method . The small sketches on the right show the loaded film in
relation to the incident beam , while the films laid out flat are indicated on the left .
644 Film loading . Figure 6 - 5 illustrates three methods of arranging the film strip
in the Debye method . The small sketches on the right show the loaded film in
relation to the incident beam , while the films laid out flat are indicated on the left .
Page 174
it will transmit and is defined by the relation D = log10 7 where Io = intensity of a
beam of light incident on the film and I = intensity of the transmitted beam . For
most x - ray films , the density is directly proportional to the exposure up to a
density ...
it will transmit and is defined by the relation D = log10 7 where Io = intensity of a
beam of light incident on the film and I = intensity of the transmitted beam . For
most x - ray films , the density is directly proportional to the exposure up to a
density ...
Page 495
Since this product is zero , H must be normal to AB . Similarly , it may be shown
that H is normal to AC . Since H is normal to two vectors in the plane ( hkl ) , it is
normal to the plane itself . To prove the reciprocal relation between H and d , let n
...
Since this product is zero , H must be normal to AB . Similarly , it may be shown
that H is normal to AC . Since H is normal to two vectors in the plane ( hkl ) , it is
normal to the plane itself . To prove the reciprocal relation between H and d , let n
...
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Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |