## Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |

### From inside the book

Results 1-3 of 83

Page 7

An increase in voltage above the critical voltage increases the intensities of the

characteristic lines

wavelengths . Figure 1 - 5 shows the spectrum of molybdenum at 35 kv on ...

An increase in voltage above the critical voltage increases the intensities of the

characteristic lines

**relative**to the continuous spectrum but does not change theirwavelengths . Figure 1 - 5 shows the spectrum of molybdenum at 35 kv on ...

Page 132

We are now in a position to gather together the factors discussed in preceding

sections into an equation for the

cos2 20 I = | F | 2p 16 sino 0 cos 0 ) ( 4 - 12 ) where I =

...

We are now in a position to gather together the factors discussed in preceding

sections into an equation for the

**relative**intensity of powder pattern lines : / 1 +cos2 20 I = | F | 2p 16 sino 0 cos 0 ) ( 4 - 12 ) where I =

**relative**integrated intensity...

Page 318

Since the

known for each line on the pattern , we can find the value of F | for each reflection

from Eq . ( 4 – 12 ) . But F measures only the

...

Since the

**relative**intensity I , the multiplicity factor p , and the Bragg angle o areknown for each line on the pattern , we can find the value of F | for each reflection

from Eq . ( 4 – 12 ) . But F measures only the

**relative**amplitude of each reflection...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Other editions - View all

Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |

### Common terms and phrases

absorption alloy angle applied atoms axis back-reflection calculated camera cause chart circle composition consider constant contains continuous copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scale scattering shown in Fig shows simple single slit solution spacing specimen stress structure substance surface temperature thickness tion transmission tube twin unit cell usually voltage wave wavelength x-ray zone