## Elements of X-ray Diffraction |

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Page 132

We are now in a position to gather together the factors discussed in preceding

sections into an equation for the

cos2 20> /= \F\2p — \ sin 6 cos 6 / (4-12) where / =

We are now in a position to gather together the factors discussed in preceding

sections into an equation for the

**relative**intensity of powder pattern lines : „ /l +cos2 20> /= \F\2p — \ sin 6 cos 6 / (4-12) where / =

**relative**integrated intensity ...Page 318

which gives the

hun+kvn+lwn) ^ (4-11) 1 which gives the value of the structure factor F for the hkl

reflection in terms of the atom positions uvw. Since the

which gives the

**relative**intensities of the reflected beams, and N P _ ^ fne2wi(hun+kvn+lwn) ^ (4-11) 1 which gives the value of the structure factor F for the hkl

reflection in terms of the atom positions uvw. Since the

**relative**intensity /, the ...Page 360

binary diagrams, along which the

not their compositions. Thus in the (a + 7) field of Fig. 12-10, tie lines have been

drawn to connect the single-phase compositions which are in equilibrium in the ...

binary diagrams, along which the

**relative**amounts of the two phases change butnot their compositions. Thus in the (a + 7) field of Fig. 12-10, tie lines have been

drawn to connect the single-phase compositions which are in equilibrium in the ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone