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Page 396
In this method a diffraction line from the phase being determined is compared
with a line from a standard substance mixed with the sample in known
proportions . The internal standard method is therefore restricted to samples in
powder form .
In this method a diffraction line from the phase being determined is compared
with a line from a standard substance mixed with the sample in known
proportions . The internal standard method is therefore restricted to samples in
powder form .
Page 407
The fluorescent radiation produced within the sample then undergoes absorption
on its way out . Since long - wavelength fluorescent radiation will be highly
absorbed by the sample , the fluorescent radiation outside the sample comes
only ...
The fluorescent radiation produced within the sample then undergoes absorption
on its way out . Since long - wavelength fluorescent radiation will be highly
absorbed by the sample , the fluorescent radiation outside the sample comes
only ...
Page 426
the mass of sample per unit area and is given by the mass of the sample divided
by the area of one face . Since Mm varies with wa for samples of constant
thickness , and may in fact vary independently of wa , it is convenient to lump the
two ...
the mass of sample per unit area and is given by the mass of the sample divided
by the area of one face . Since Mm varies with wa for samples of constant
thickness , and may in fact vary independently of wa , it is convenient to lump the
two ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |