Elements of X-ray Diffraction |
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Page 396
The internal standard method is therefore restricted to samples in powder form.
Suppose we wish to determine the amount of phase A in a mixture of phases A, B
, C, . . . , where the relative amounts of the other phases present (B, C, D, .
The internal standard method is therefore restricted to samples in powder form.
Suppose we wish to determine the amount of phase A in a mixture of phases A, B
, C, . . . , where the relative amounts of the other phases present (B, C, D, .
Page 407
The fluorescent radiation produced within the sample then undergoes absorption
on its way out. Since long-wavelength fluorescent radiation will be highly
absorbed by the sample, the fluorescent radiation outside the sample comes only
from ...
The fluorescent radiation produced within the sample then undergoes absorption
on its way out. Since long-wavelength fluorescent radiation will be highly
absorbed by the sample, the fluorescent radiation outside the sample comes only
from ...
Page 426
the mass of sample per unit area and is given by the mass of the sample divided
by the area of one face. Since Mm varies with w\ for samples of constant
thickness, and may in fact vary independently of w\, it is convenient to lump the
two ...
the mass of sample per unit area and is given by the mass of the sample divided
by the area of one face. Since Mm varies with w\ for samples of constant
thickness, and may in fact vary independently of w\, it is convenient to lump the
two ...
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |