Elements of X-ray Diffraction |
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Page 108
The wavelength X2 of the scattered radiation is thus slightly greater than the
wavelength Xi of the incident beam, the magnitude of the change being given by
the equation AX(A) = X2 - Xi = 0.0243 (1 - cos 20). (4-3) The increase in
wavelength ...
The wavelength X2 of the scattered radiation is thus slightly greater than the
wavelength Xi of the incident beam, the magnitude of the change being given by
the equation AX(A) = X2 - Xi = 0.0243 (1 - cos 20). (4-3) The increase in
wavelength ...
Page 109
This is not true for other directions of scattering. The fact that the electrons of an
atom are situated at different points in space introduces differences in phase
between the waves scattered by different electrons. Consider Fig. 4-5, in which, ...
This is not true for other directions of scattering. The fact that the electrons of an
atom are situated at different points in space introduces differences in phase
between the waves scattered by different electrons. Consider Fig. 4-5, in which, ...
Page 488
The main difference between neutron diffraction on the one hand and x-ray and
electron diffraction on the other lies in the variation of atomic scattering power*
with atomic number Z and with scattering angle 20. The scattering power of an ...
The main difference between neutron diffraction on the one hand and x-ray and
electron diffraction on the other lies in the variation of atomic scattering power*
with atomic number Z and with scattering angle 20. The scattering power of an ...
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |