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Page 108
( 4 - 3 ) The increase in wavelength depends only on the scattering angle , and it
varies from zero in the forward direction ( 20 = 0 ) to 0 . 05A in the extreme
backward direction ( 20 = 180° ) . Radiation so scattered is called Compton
modified ...
( 4 - 3 ) The increase in wavelength depends only on the scattering angle , and it
varies from zero in the forward direction ( 20 = 0 ) to 0 . 05A in the extreme
backward direction ( 20 = 180° ) . Radiation so scattered is called Compton
modified ...
Page 109
This is not true for other directions of scattering . The fact that the electrons of an
atom are situated at different points in space introduces differences in phase
between the waves scattered by different electrons . Consider Fig . 4 - 5 , in which
...
This is not true for other directions of scattering . The fact that the electrons of an
atom are situated at different points in space introduces differences in phase
between the waves scattered by different electrons . Consider Fig . 4 - 5 , in which
...
Page 488
The scattering power of an atom increases as Z increases and decreases as 20
increases , both for x - rays and for ... Neutrons , however , are scattered with the
same intensity at all scattering angles and with a fine disregard for atomic
number ...
The scattering power of an atom increases as Z increases and decreases as 20
increases , both for x - rays and for ... Neutrons , however , are scattered with the
same intensity at all scattering angles and with a fine disregard for atomic
number ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |