Elements of X-ray Diffraction |
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Page 67
Figure 2-3 1(a) is a projection of the two poles Pi and P2 shown in perspective in
Fig. 2-26, and the angle between them is found by the rotation illustrated in Fig. 2
-3 1(b). This rotation of the projection is equivalent to rotation of the poles on ...
Figure 2-3 1(a) is a projection of the two poles Pi and P2 shown in perspective in
Fig. 2-26, and the angle between them is found by the rotation illustrated in Fig. 2
-3 1(b). This rotation of the projection is equivalent to rotation of the poles on ...
Page 224
These angles are then used to determine the three arcs shown in Fig. 8-8. These
are circle arcs, but they are not centered on the corresponding poles; rather, each
one is the locus of points located at an equal angular distance from the pole ...
These angles are then used to determine the three arcs shown in Fig. 8-8. These
are circle arcs, but they are not centered on the corresponding poles; rather, each
one is the locus of points located at an equal angular distance from the pole ...
Page 235
Whether the chart or the ruler is employed to plot the poles of reflecting planes,
they are indexed in the same way as back-reflection patterns. For example, the
transmission Laue pattern shown in Fig. 8-19 in the form of a tracing yields the ...
Whether the chart or the ruler is employed to plot the poles of reflecting planes,
they are indexed in the same way as back-reflection patterns. For example, the
transmission Laue pattern shown in Fig. 8-19 in the form of a tracing yields the ...
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |