## Elements of X-ray Diffraction |

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Page 67

Figure 2-3 1(a) is a projection of the two poles Pi and P2

-3 1(b). This rotation of the projection is equivalent to rotation of the poles on ...

Figure 2-3 1(a) is a projection of the two poles Pi and P2

**shown**in perspective in**Fig**. 2-26, and the angle between them is found by the rotation illustrated in**Fig**. 2-3 1(b). This rotation of the projection is equivalent to rotation of the poles on ...

Page 224

These angles are then used to determine the three arcs

are circle arcs, but they are not centered on the corresponding poles; rather, each

one is the locus of points located at an equal angular distance from the pole ...

These angles are then used to determine the three arcs

**shown in Fig**. 8-8. Theseare circle arcs, but they are not centered on the corresponding poles; rather, each

one is the locus of points located at an equal angular distance from the pole ...

Page 235

Whether the chart or the ruler is employed to plot the poles of reflecting planes,

they are indexed in the same way as back-reflection patterns. For example, the

transmission Laue pattern

Whether the chart or the ruler is employed to plot the poles of reflecting planes,

they are indexed in the same way as back-reflection patterns. For example, the

transmission Laue pattern

**shown in Fig**. 8-19 in the form of a tracing yields the ...### What people are saying - Write a review

#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone