## Elements of X-ray Diffraction |

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Page 300

value of

The Kp line corresponding to a given Ka line is always located at a smaller angle

20 and has lower intensity. However, since Ka and K0 lines (from different ...

value of

**sin2**6 for some Ka line on the pattern, unless the product exceeds unity.The Kp line corresponding to a given Ka line is always located at a smaller angle

20 and has lower intensity. However, since Ka and K0 lines (from different ...

Page 312

For example, the

constants for any one pattern. The problem is to find these constants, since, once

found ...

For example, the

**sin2**6 values in the tetragonal system must obey the relation :**sin2**6 = A(h2 + k2) + CI2, (10-7) where A ( = X2/4a2) and C ( = X2/4c2) areconstants for any one pattern. The problem is to find these constants, since, once

found ...

Page 342

Then X2 4 h2 + hk + k2 X2 I2

-Scherrer camera. By rearranging this equation and introducing new symbols, we

...

Then X2 4 h2 + hk + k2 X2 I2

**sin2**6 (true) = - - + - - — 4 3 Oq 4 c02 and X2 X2**sin2**6 (h2 + hk + k2) (I2) = D**sin2**20, 3oo2 4c02 if the pattern is made in a Debye-Scherrer camera. By rearranging this equation and introducing new symbols, we

...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone