Elements of X-ray Diffraction |
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Page 143
5-3 Specimen holders. Before going into the question of specimen holders, we
might consider the specimen itself. Obviously, a specimen for the transmission
method must have low enough absorption to transmit the diffracted beams; ...
5-3 Specimen holders. Before going into the question of specimen holders, we
might consider the specimen itself. Obviously, a specimen for the transmission
method must have low enough absorption to transmit the diffracted beams; ...
Page 164
In the transmission method, the value of 6 for a particular reflection is found from
the relation U tan 20 = — □ (6-10) 2D where U = diameter of the Debye ring and
D = specimen-to-film distance. The corresponding relation for the back-reflection
...
In the transmission method, the value of 6 for a particular reflection is found from
the relation U tan 20 = — □ (6-10) 2D where U = diameter of the Debye ring and
D = specimen-to-film distance. The corresponding relation for the back-reflection
...
Page 184
The powder should be ground extremely fine, to a size of 10 microns or less, if
relative line intensities are to be accurately reproducible; since the flat specimen
is not rotated as a Debye-Scherrer specimen is, the only way of obtaining an ...
The powder should be ground extremely fine, to a size of 10 microns or less, if
relative line intensities are to be accurately reproducible; since the flat specimen
is not rotated as a Debye-Scherrer specimen is, the only way of obtaining an ...
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |