## Elements of X-ray Diffraction |

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Page 498

Therefore 2 sin 0 S - S0 = H = -- d or X = 2d sin 0.

The Ewald construction. Section through the

incident and diffracted beam vectors. The conditions for diffraction expressed by ...

Therefore 2 sin 0 S - S0 = H = -- d or X = 2d sin 0.

**sphere**of reflection Fig. A15-8.The Ewald construction. Section through the

**sphere**of reflection containing theincident and diffracted beam vectors. The conditions for diffraction expressed by ...

Page 500

When the reciprocal lattice rotates, this plane cuts the reflection

small circle shown, and any points on the I = 1 layer which touch the

surface must touch it on this circle. Therefore all diffracted-beam vectors S/X must

end on ...

When the reciprocal lattice rotates, this plane cuts the reflection

**sphere**in thesmall circle shown, and any points on the I = 1 layer which touch the

**sphere**surface must touch it on this circle. Therefore all diffracted-beam vectors S/X must

end on ...

Page 501

through all possible positions. The reflection

origin of the reciprocal lattice and sweeps out a

**sphere**of reflectior Fig. A15-11. The limiting**sphere**for the powder method.through all possible positions. The reflection

**sphere**therefore swings about theorigin of the reciprocal lattice and sweeps out a

**sphere**of radius 2/X, called the ...### What people are saying - Write a review

#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone