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Page 264
CRYSTAL LATTICE DIFFRACTION The effect of strain , both uniform LINE and
nonuniform , on the direction of X - ray reflection is illustrated in Fig . 9 – 2 . A
portion of an unstrained grain appears in ( a ) on the left , and the set of
transverse ...
CRYSTAL LATTICE DIFFRACTION The effect of strain , both uniform LINE and
nonuniform , on the direction of X - ray reflection is illustrated in Fig . 9 – 2 . A
portion of an unstrained grain appears in ( a ) on the left , and the set of
transverse ...
Page 431
When a polycrystalline piece of metal is deformed elastically in such a manner
that the strain is uniform over relatively large distances , the lattice plane
spacings in the constituent grains change from their stress - free value to some
new value ...
When a polycrystalline piece of metal is deformed elastically in such a manner
that the strain is uniform over relatively large distances , the lattice plane
spacings in the constituent grains change from their stress - free value to some
new value ...
Page 451
The proper field of application of the x - ray method will become evident if we
compare its features with those of other methods of stress , or rather strain ,
measurement . If a camera with a pinhole collimator is used , the incident x - ray
beam ...
The proper field of application of the x - ray method will become evident if we
compare its features with those of other methods of stress , or rather strain ,
measurement . If a camera with a pinhole collimator is used , the incident x - ray
beam ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |