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Page 431
CHAPTER 17 STRESS MEASUREMENT 17 – 1 Introduction . When a
polycrystalline piece of metal is deformed elastically in such a manner that the
strain is uniform over relatively large distances , the lattice plane spacings in the
constituent ...
CHAPTER 17 STRESS MEASUREMENT 17 – 1 Introduction . When a
polycrystalline piece of metal is deformed elastically in such a manner that the
strain is uniform over relatively large distances , the lattice plane spacings in the
constituent ...
Page 451
curve be corrected by an amount ( 420 ) , + 1 experimental measured on a stress
- free sample in the manner previously described . The corrected working curve is
therefore a line of the same slope as the expericorrected mental curve but ...
curve be corrected by an amount ( 420 ) , + 1 experimental measured on a stress
- free sample in the manner previously described . The corrected working curve is
therefore a line of the same slope as the expericorrected mental curve but ...
Page 452
RESIDUAL STRESS ( 1000 psi ) - 10 ( a ) etching , etc . , and ( b ) measuring the
change in shape or dimensions produced as a result of this removal . For
example , the residual stress in the weldment discussed earlier ( Fig . 17 - 1 ( b ) ]
could ...
RESIDUAL STRESS ( 1000 psi ) - 10 ( a ) etching , etc . , and ( b ) measuring the
change in shape or dimensions produced as a result of this removal . For
example , the residual stress in the weldment discussed earlier ( Fig . 17 - 1 ( b ) ]
could ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone