Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
From inside the book
Results 1-3 of 9
Page vi
tion pattern . The entire book is written in terms of the Bragg law and can be read
without any knowledge of the reciprocal lattice . ( However , a brief treatment of
reciprocal - lattice theory is given in an appendix for those who wish to pursue the
...
tion pattern . The entire book is written in terms of the Bragg law and can be read
without any knowledge of the reciprocal lattice . ( However , a brief treatment of
reciprocal - lattice theory is given in an appendix for those who wish to pursue the
...
Page 169
Monochromatic reflecobtained by using a bent and cut crys - tion when the
incident beam is nontal , which operates on the focusing parallel . principle
illustrated in Fig . 6 – 15 . A line source of x - rays , the focal line on the tube target
, is ...
Monochromatic reflecobtained by using a bent and cut crys - tion when the
incident beam is nontal , which operates on the focusing parallel . principle
illustrated in Fig . 6 – 15 . A line source of x - rays , the focal line on the tube target
, is ...
Page 513
... 266 Setting a crystal in a required orientaPowder method , 93 , 149 , 500 tion ,
240 Preferred orientation ( see Texture ) Short - range order , 375 , 376 Primitive
cells , 33 , 36 Short - wavelength limit , 5 Principal stresses , 436 SIEGBAHN , M .
... 266 Setting a crystal in a required orientaPowder method , 93 , 149 , 500 tion ,
240 Preferred orientation ( see Texture ) Short - range order , 375 , 376 Primitive
cells , 33 , 36 Short - wavelength limit , 5 Principal stresses , 436 SIEGBAHN , M .
What people are saying - Write a review
LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
Other editions - View all
Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone