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Page 55
In the case of a reflection twin , the composition plane may or may not coincide
with the twin plane . ... who deal mainly with FCC , BCC , and HCP structures ,
are the following kinds of twins : ( 1 ) Annealing twins , such as occur in FCC
metals ...
In the case of a reflection twin , the composition plane may or may not coincide
with the twin plane . ... who deal mainly with FCC , BCC , and HCP structures ,
are the following kinds of twins : ( 1 ) Annealing twins , such as occur in FCC
metals ...
Page 57
The plane of the main drawing is ( 110 ) , the ( 111 ) twin plane is perpendicular
to this plane , and the [ 111 ] twin axis lies in it . Open circles represent atoms in
the plane of the drawing and filled circles those in the layers immediately above
or ...
The plane of the main drawing is ( 110 ) , the ( 111 ) twin plane is perpendicular
to this plane , and the [ 111 ] twin axis lies in it . Open circles represent atoms in
the plane of the drawing and filled circles those in the layers immediately above
or ...
Page 58
convincing evidence for this view has been advanced and it is generally held that
annealing twins are the result of the growth ... In each case , the orientation
relationship between parent crystal and twin is that of reflection across a plane .
convincing evidence for this view has been advanced and it is generally held that
annealing twins are the result of the growth ... In each case , the orientation
relationship between parent crystal and twin is that of reflection across a plane .
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |