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Page 19
One lead of the high - voltage transformer is connected to the filament and the
other to ground , the target being grounded by its own coolingwater connection .
The filament is heated by a filament current of about 3 amp and emits electrons ...
One lead of the high - voltage transformer is connected to the filament and the
other to ground , the target being grounded by its own coolingwater connection .
The filament is heated by a filament current of about 3 amp and emits electrons ...
Page 193
If the voltage on a proportional counter is increased some hundreds of volts , it
will act as a Geiger counter . The exact operating voltage is determined in the
following way . The counter is exposed to a beam of x - rays of constant intensity
and ...
If the voltage on a proportional counter is increased some hundreds of volts , it
will act as a Geiger counter . The exact operating voltage is determined in the
following way . The counter is exposed to a beam of x - rays of constant intensity
and ...
Page 199
VOLTAGE ( kv ) the tube voltage exceeds the critical excitation voltage of the
target material . Suppose , for example , that a copper target ( excitation voltage =
9 kv ) is operated at a peak voltage 6 of 50 kv . Then , if the wave form is like that
...
VOLTAGE ( kv ) the tube voltage exceeds the critical excitation voltage of the
target material . Suppose , for example , that a copper target ( excitation voltage =
9 kv ) is operated at a peak voltage 6 of 50 kv . Then , if the wave form is like that
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone