## Elements of X-ray Diffraction |

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Page 109

The fact that the electrons of an atom are situated at different points in space

introduces differences in phase between the

electrons. Consider Fig. 4-5, in which, for simplicity, the electrons are shown as

points ...

The fact that the electrons of an atom are situated at different points in space

introduces differences in phase between the

**waves**scattered by differentelectrons. Consider Fig. 4-5, in which, for simplicity, the electrons are shown as

points ...

Page 115

variations in electric field intensity E with time t of two rays on any given

front in a diffracted x-ray beam. Their equations may be written Ei = Ax sin (2irvt ...

**wave**vector in the The two**waves**shown as full lines in Fig. 4-10 represent thevariations in electric field intensity E with time t of two rays on any given

**wave**front in a diffracted x-ray beam. Their equations may be written Ei = Ax sin (2irvt ...

Page 116

(4-8) Thus the

8). The expression on the left is called a complex exponential function. Since the

intensity of a

(4-8) Thus the

**wave**vector may be expressed analytically by either side of Eq. (4-8). The expression on the left is called a complex exponential function. Since the

intensity of a

**wave**is proportional to the square of its amplitude, we now need ...### What people are saying - Write a review

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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone