Elements of X-ray Diffraction |
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Page 5
h 2 2 X 1.0 2.0 WAVELENGTH (angstroms) 3.0 Fig. 1-4. X-ray spectrum of
molybdenum as a function of applied voltage (schematic). Line widths not to
scale. with wavelength is found to depend on the tube voltage. Figure 1-4 shows
the kind of ...
h 2 2 X 1.0 2.0 WAVELENGTH (angstroms) 3.0 Fig. 1-4. X-ray spectrum of
molybdenum as a function of applied voltage (schematic). Line widths not to
scale. with wavelength is found to depend on the tube voltage. Figure 1-4 shows
the kind of ...
Page 12
termed hard, while long-wavelength x-rays are easily absorbed and are said to
be soft. Matter absorbs x-rays in two distinct ways, by scattering and by true
absorption, and these two processes together make up the total absorption
measured ...
termed hard, while long-wavelength x-rays are easily absorbed and are said to
be soft. Matter absorbs x-rays in two distinct ways, by scattering and by true
absorption, and these two processes together make up the total absorption
measured ...
Page 414
Here we are concerned mainly with the variation in counter behavior with
variation in x-ray wavelength. This variation is of no great importance in
diffractometer measurements, since all diffracted beams have the same
wavelength.
Here we are concerned mainly with the variation in counter behavior with
variation in x-ray wavelength. This variation is of no great importance in
diffractometer measurements, since all diffracted beams have the same
wavelength.
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | reprint |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |