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Page 12
termed hard , while long - wavelength x - rays are easily absorbed and are said
to be soft . Matter absorbs x - rays in two distinct ways , by scattering and by true
absorption , and these two processes together make up the total absorption ...
termed hard , while long - wavelength x - rays are easily absorbed and are said
to be soft . Matter absorbs x - rays in two distinct ways , by scattering and by true
absorption , and these two processes together make up the total absorption ...
Page 13
As the wavelength of the incident beam is decreased below Xk , the absorption
coefficient begins to decrease again , even though the production of K
fluorescent radiation and photoelectrons is still occurring . At a wavelength of 1 .
0A , for ...
As the wavelength of the incident beam is decreased below Xk , the absorption
coefficient begins to decrease again , even though the production of K
fluorescent radiation and photoelectrons is still occurring . At a wavelength of 1 .
0A , for ...
Page 414
Here we are concerned mainly with the variation in counter behavior with
variation in x - ray wavelength . This variation is of no great importance in
diffractometer measurements , since all diffracted beams have the same
wavelength .
Here we are concerned mainly with the variation in counter behavior with
variation in x - ray wavelength . This variation is of no great importance in
diffractometer measurements , since all diffracted beams have the same
wavelength .
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
CHAPTER | 1 |
CHAPTER 2 | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
16 other sections not shown
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy angle applied atoms axis Bragg calculated called camera cause circle composition consider constant contains copper corresponding counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation origin parallel parameter particular pattern percent phase photograph planes pole position possible powder produced projection proportional radiation rays reciprocal reference reflection relation relative result rotation sample scattering shown in Fig shows simple single slit solid solution spacing specimen sphere strain stress structure substance surface temperature tion tube twin unit cell usually vector voltage wave wavelength x-ray zone
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| Original from | University of Minnesota |
| Digitized | 15 Jan 2010 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |