Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 215
... x - ray methods of determining crystal orientation will be described : the back - reflection Laue method , the trans- mission Laue method , and the diffractometer method . It is also con- venient to treat here the question of crystal ...
... x - ray methods of determining crystal orientation will be described : the back - reflection Laue method , the trans- mission Laue method , and the diffractometer method . It is also con- venient to treat here the question of crystal ...
Page 431
... procedure involving measurement of the strains produced by known stresses . X - ray diffraction can therefore be used as a method of " stress " measurement . Note , however , that stress is not measured directly by the x - ray method or ...
... procedure involving measurement of the strains produced by known stresses . X - ray diffraction can therefore be used as a method of " stress " measurement . Note , however , that stress is not measured directly by the x - ray method or ...
Page 451
... x - ray method will become evident if we compare its features with those of other methods of stress , or rather strain , measurement . If a camera with a pinhole col- limator is used , the incident x ... method is preferable whenever we wish ...
... x - ray method will become evident if we compare its features with those of other methods of stress , or rather strain , measurement . If a camera with a pinhole col- limator is used , the incident x ... method is preferable whenever we wish ...
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Common terms and phrases
absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper atoms cosĀ² counter cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained Orthorhombic parallel percent phase photograph pinhole plotted pole figure position powder pattern preferred orientation projection reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinĀ² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission unit cell values vector voltage wavelength x-ray diffraction x-ray method x-ray tube zero zone